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PSP与HiSIM性能基准比照

美国 加州圣克拉拉县, 2007年8月30日

SILVACO has assembled a set of test circuits for a 90nm technology by adapting a subset of North Carolina University test circuits. The test crcuits cover a wide range of circuit sizes from a few transistors, to several milion transistors. Very large circuits are available with and without parasitic back-annotated elements. The 90nm technology used for the benchmarks is process data that has been created by simulating a typical 90nm process technology using SILVACO's TCAD software.

Model parameters for BSIM3, BSIM4, HiSIM and PSP have been extracted for this purpose using UTMOST IV software.

Please contact SILVACO for a 30-day evaluation license to run the SmartSpice executable used for this benchmark.

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