SPAYN and its Competitors

SPAYN (Statistical Parameter and Yield Analysis) is a statistical analysis and non-linear modeling tool. SPAYN analyses variances from model parameter extraction sequences, electrical test routines, and circuit test measurements. SPAYN can be used in place of Agilent IC-CAP statistics package or BTA SIGMAPro technology. Unlike SAS, SPSS, SYSTAT, MINITAB or DATADESK that require doctorate-level statisticians, SPAYN is a comprehensive, user friendly tool with advanced, flexible and powerful feature tailored for the semiconductor industry.

• Helps to identify the relationship between device or circuit performance variations and the process fluctuations.
• Parametric analysis includes Principal Component Analysis (PCA), Principal Factor Analysis (PFA)
• Multiple linear and nonlinear regression.
• Automatic generation of worst-case and corner SPICE models
• Identification of inter-relationship among groups of parameters
• Statistical process control, process monitor, and yield analysis
• Advanced Wafer Map displaying wafer-to-wafer and die-to-die variances
• Seamless integration with fast SmartSpice API for statistical circuit design
• Flexible data input, output, append, merge, and split options.
• Golden Sample close to the mean calculation
• Monte Carlo Analysis
• Corner and Parametric Boundary Modeling
• Advanced histogram, 2D & 3D scatter plot and response surface model display options
• Integrated with SILVACO VWFII Software for smooth development of pre-silicon models