发表论文 　

发表论文 - 全定制 IC CAD

The full text of most of these papers may be found at the IEEE website at www.ieee.org.

G. Vakanas, S. Munir, E.Tejnil, D. Bald, R. Nagpal "Lithography-based automation in the Design
of Program Defect Masks" Proc. SPIE Feb. 2004