Standard Cell Statistical Characterization with VarMan

With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When combined with supply voltage and temperature variation, traditional approaches to finding 3-sigma process corners or performing 6-sigma verification becomes impractical due to the large number of simulations that are required. In this webinar we will review how VarMan, from Silvaco, addresses this problem. The VarMan suite of tools includes Fast Monte Carlo, Variability eXplorer, high-sigma Yield Estimation, high-sigma Performance Limit, and library VarMan. These unique tools greatly reduce the number of simulations required for standard cell library characterization and quality assurance, while maintaining high accuracy, which makes design and characterization in the presence of variation feasible.

What attendees will learn:

  • Key challenges of Standard Cell Statistical Characterization
    • Large number of process corners
    • Difficulty in finding worst case conditions
    • Large number of simulations required for high-sigma verification
    • Situation complicated by local mismatch
  • Overview of statistics related to standard cell statistical characterization
  • Application of VarMan to Standard Cell Library Characterization
    • Fast Monte Carlo
    • Variability eXplorer
    • High-sigma performance limit and yield analysis
    • Library VarMan


Dr. Prashant Singh is an Applications Engineer with Silvaco Corporation.
After graduating with a B.Sc in Physics with Electrical Engineering at the Massachusetts Institute of Technology, Prashant Singh worked for the General Electric Company, where he completed the Edison Engineering Program, and obtained a M.Sc and Ph.D in Electrical Engineering from the Rensselaer Polytechnic Institute. After completing his Ph.D, Dr. Singh developed high speed optoelectronic components at Lucent Technologies, and high speed serial interfaces for LSI Corporation, Qlogic, Koolchip, and Invecas. Dr. Singh is currently an application engineer at Silvaco, with specializations in circuit verification and quality assurance.

Who should attend:

Design and verification engineers and management looking for solutions to increase the efficiency and accuracy of standard cell library characterization.